Add XML doc standards; enable compiler-generated files
Added "XML Documentation" section to CONVENTIONS.md, specifying usage of <summary> tags for developer-facing comments and restricting implementation details to external docs. Enabled EmitCompilerGeneratedFiles in FruitBank.Common.csproj for improved debugging and analysis.
This commit is contained in:
parent
5b0b080b5a
commit
352b3b2d21
|
|
@ -5,7 +5,7 @@
|
||||||
<ImplicitUsings>enable</ImplicitUsings>
|
<ImplicitUsings>enable</ImplicitUsings>
|
||||||
<Nullable>enable</Nullable>
|
<Nullable>enable</Nullable>
|
||||||
<CopyLocalLockFileAssemblies>true</CopyLocalLockFileAssemblies>
|
<CopyLocalLockFileAssemblies>true</CopyLocalLockFileAssemblies>
|
||||||
<EmitCompilerGeneratedFiles>false</EmitCompilerGeneratedFiles>
|
<EmitCompilerGeneratedFiles>true</EmitCompilerGeneratedFiles>
|
||||||
</PropertyGroup>
|
</PropertyGroup>
|
||||||
|
|
||||||
<ItemGroup>
|
<ItemGroup>
|
||||||
|
|
|
||||||
|
|
@ -14,6 +14,10 @@
|
||||||
- **OnGrid prefix** for MgGridBase event parameters: `OnGridItemDeleting`, `OnGridEditModelSaving`, `OnGridFocusedRowChanged`, etc. (avoids collision with DxGrid base events).
|
- **OnGrid prefix** for MgGridBase event parameters: `OnGridItemDeleting`, `OnGridEditModelSaving`, `OnGridFocusedRowChanged`, etc. (avoids collision with DxGrid base events).
|
||||||
- **SignalRTags** constants use numeric ranges by domain (see `FruitBank.Common/SignalRs/`).
|
- **SignalRTags** constants use numeric ranges by domain (see `FruitBank.Common/SignalRs/`).
|
||||||
|
|
||||||
|
## XML Documentation
|
||||||
|
|
||||||
|
`<summary>` — brief, developer-facing, readable in VS IntelliSense tooltip. NO implementation details, NO wire-format / byte-level / perf specifics — those live in `docs/TOPIC/*.md`. Add `<example>` only when usage is non-obvious; otherwise omit.
|
||||||
|
|
||||||
## Patterns
|
## Patterns
|
||||||
|
|
||||||
- **MeasuringItemPalletBase** as abstract base for all three measurement hierarchies.
|
- **MeasuringItemPalletBase** as abstract base for all three measurement hierarchies.
|
||||||
|
|
|
||||||
Loading…
Reference in New Issue